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Volume 8, Number 1, January 1997
Flicker Noise Measurement and SPICE Parameter Extractionfor Modeling and Characterization Service (Part 2)
Fundamental Improvements in BSIM3v3.1 Model (Available in SmartSpice)
Automated Model Binning
Hints & Tips
Volume 8, Number 3, March 1997
UCSD HBT SmartSpice Model Released!
Measuring Ring Oscillator Time Delay for CMOS, SOI and TFT Technologies
Improved and Expanded Reedholm Interface to UTMOST
Simulation of SOI Analog Circuits with SmartSpice
Simulation and Optimization of CMOS Noise Parameter (Part III)
Further Automation of Worst-Case SPICE Model Library Generation
New Release of PC SmartSpice
Diagnose Process Variations By Using SPC Charts and a Wafer Map
Diagnose Process Variations By Using Wafer Map and Highlighted Histogram Plot
Volume 8, Number 4, April 1997
QUANTUM: Quantum Mechanical Simulator Released in ATLAS
SIMS-Verified Implant Models Released in ATHENA 4.3
Modifications and Additions to the Ferroelectric Model in ATLAS
Volume 8, Number 6, June 1997
CLEVER - Process Technology Based Extraction and Optimization of Custom Cell Parasitics
EXACT - Process Technology Based Interconnect Parasitic Library Generation
Blaze Simulation of SiGe:Si Heterostructure p-MOSFETs
Volume 8, Number 7, July 1997
Custom Implementation of Noise Models Using the SmartSpice Interpreter
An Efficient Use of Threads for SmartSpice Parallelization
Trouble-Shooting GPIB Communication Problems
Generation of a New SPAYN Database from a Limited Data Set
Volume 8, Number 9, September 1997
Introducing Expert ULSI Layout Processor for PC-based Platforms
Chip Navigation in Expert
Introducing Savage - Efficient Design Rule Checker for PC-based Platforms
Generalized Convexity Approach to Cell Boundary Shape Approximation
Volume 8, Number 10, October 1997
SmartLib: Product-Independent SPICE Model Library
Parallel SmartSpice for PC
BSIM3v3.1 Intrinsic Capacitance Modeling in UTMOST
A New C-Interpreter
RPI Polysilicon and Amorphous TFT Implemented in SmartSpice
Volume 8, Number 12, December 1997
Expert - PC NT Layout Editor
Minimal Area Design of Power/Ground Nets
Application of Scan Line Methodology to Perform Metric Operations in DRC