Simulation Standard - 1996

Volume 7, Number 1, January 1996

A SPAYN Analysis of Circuit Performance Data Obtained Using the Virtual Wafer Fab

Model Validation Using SmartSpice

BJT S-Parameter Measurement and Analysis Using UTMOST

Hints & Tips

Volume 7, Number 3, March 1996

New Features in UTMOST Version 12.03.0

New Features in SPAYN version 1.6.0

New Features and Bug Fixes in SmartSpice Version 1.4.0

Hints & Tips

Volume 7, Number 4, April 1996

Transient Simulation of CMOS Device Latch-up

Simulation of ESD Pulse in a MOSFET Device

Simulation of AlGaAs/ GaAs HEMT

Simulation of Latch-up in an n-Channel IGBT

Simulation of Device Characteristics for a Silicon-on-Insulator MOSFET Device

Simulation of PMOS Device Characterization

Volume 7, Number 5, September 1996

Comprehensive MOS Model Validation Environment Case Study: BSIM3v3

Multi-Plot Rubberband Option is Implemented in UTMOST

Wafer Map Distribution of Statistically Correlated Parameters

Running SmartSpice from the Cadence Framework

Extraction of the Effective Length and Width of Submicron MOS Transistors

MEXTRAM Biploar Implementation in SmartSpice

Hints & Tips

Volume 7, Number 6, October 1996

Advanced Diffusion Models Released in ATHENA 4.0

New ATLAS Release Supports Parallelization, Large Number of Advanced Models, and FRAM

Interactive Tools Continue to Stay Miles Ahead........".

Volume 7, Number 8, December 1996

Advanced Analytical Ion Implantation Models in ATHENA

New Quantum Mechanical Simulator in ATLAS

Accurate Extraction of Interconnect Parasitics Based on 3D Back-End Process Simulation

Simulation of Ferroelectric Materials (FRAM Devices) in ATLAS

Hints & Tips