ModelLib Dynamically-Linked SPICE Models
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HV MOS
BSIM3-based High Voltage Compact Model
HiSIM HV
Surface Potential Based HV and LDMOS Compact Model
PSP
Surface Potential-Based MOSFET Model
BSIM3v3.2.4
Industry Standard
Sub-0.13 Micron
MOSFET Model
BSIMMG
Berkeley Common Multi-Gate Transistor Model
BSIM3SOIv3.2
Industry Standard
SOI Model
BSIM4v4
Industry Standard
Sub-0.13 Micron
MOSFET Model
EKV
Low Power
MOSFET Model
HICUM
High Speed
Bipolar Model
HiSIM
Surface Potential-
Based MOSFET Model
Mextram
General Purpose
Bipolar Model
Mosvar
PSP-Based MOS
Varactor Model
UOTFT
Universal Organic TFT Model
Modella
Lateral PNP
Bipolar Model
ModelLib
Latest ModelLib Models
The Origin and Goal of VBIC
The Vertical Bipolar Inter-Company (VBIC) model results from the joint efforts of semiconductor and EDA companies to develop a successor of the 30-year-old industry standard SPICE Gummel-Poon (SPG) bipolar transistor model. VBIC follows the basic general concept of SGP but overcomes its major deficiencies and brings a variety of new advanced BJT and HBT modeling features. At the same time, VBIC is developed to provide the maximum backward compatibility with the SPG model in order to leverage the existing knowledge and training of characterization and IC design engineers. Today, VBIC is the only model widely adopted by both BJT and HBT foundry and circuit design industries.
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| HBT output characteristics of demonstrating VBIC electro-thermal modeling. |
Fundamental VBIC Improvements Over SGP
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| Early voltage modeling of VBIC and SGP. |
Simucad Implementation
Simucad Enhanced VBIC Model Features
To meet the growing circuit design requirements and to enlarge the range of the VBIC model applicability, Simucad has introduced an enhanced VBIC model version v1.3. The enhanced VBIC modeling features include:
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| The effect of the recombination in quasi-neutral base on a transistor output characteristics. |
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| The effect of non-uniform (graded) band-gap in the quasi-neutral base on a transistor current gain. |
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| The effect of temperature dependent thermal resistance on the transistor temperature in output characteristics. |
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| The temperature dependent forward transit times form different Vce. |
Rev. 050108_04
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